Analysis of Strain Depth Variations in an In(0.19)Ga(0.81)N Layer by Raman Spectroscopy

AuthID
 P-000-RCV
8
Author(s)
Frandon, J
·
Renucci, MA
·
Sequeira, AD
·
2
Editor(s)
Hoffmann, A; Rizzi, A
Document Type
Proceedings Paper
Year published
2002
Published
in INTERNATIONAL WORKSHOP ON NITRIDE SEMICONDUCTORS, PROCEEDINGS, ISSN: 1610-1634
Volume: 0, Issue: 1, Pages: 563-567 (5)
Conference
International Workshop on Nitride Semiconductors (Iwn 2002), Date: JUL 22-25, 2002, Location: AACHEN, GERMANY, Sponsors: Res Ctr Julich, AIXTRON, Deutsch Forsch Gemeinsch, European Off Aerosp Res & Dev, Deutsch Gesell Kristallwachstum & Kristallzucht
Indexing
Wos®
Scopus®
Crossref®6
Google Scholar®
Publication Identifiers
Scopus: 2-s2.0-29644436365
Wos: WOS:000189455300124
Source Identifiers
ISSN: 1610-1634
Export Publication Metadata
Lista Marked
 Adicionar à lista Marked
Info
At this moment we don't have any links to full text documens.

Um espaço para investigadores e suas instituições

Useful Links

Get Help

© 2024 CRACS & Inesc TEC - All Rights Reserved Privacy Policy | Terms of Service