Characterization of Ni-Ti (Shape Memory Alloy) Thin Film by In-Situ Xrd and Complementary Ex-Situ Techniques

AuthID
 P-007-PK2
7
Author(s)
Schell, N
·
Reuther, H
·
Mahesh, KK
·
7
Editor(es)
Marques, AT; Silva, AF; Baptista, APM; Sa, C; Alves, FJLA; Malheiros, LF; Vieira, M
Tipo de Documento
Proceedings Paper
Year published
2008
Publicado
in ADVANCED MATERIALS FORUM IV in MATERIALS SCIENCE FORUM, ISSN: 0255-5476
Volume: 587-588, Páginas: 672-676 (5)
Conference
13Th Conference of the Sociedade-Portuguesa-De-Materiais/4Th International Materials Symposium, Date: APR 01-04, 2007, Location: Oporto, PORTUGAL
Indexing
Wos®
Scopus®
Publication Identifiers
SCOPUS: 2-s2.0-60349088826
Wos: WOS:000259898200133
Source Identifiers
ISSN: 0255-5476
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