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An Empirical Study on the Usage of Testability Information to Fault Localization in Software
AuthID
P-007-YS3
P-007-YS3
4
Author(s)
4
Editor(es)
William C. Chu; W. Eric Wong; Mathew J. Palakal; Chih-Cheng Hung
Tipo de Documento
Proceedings Paper
Year published
2011
Publicado
in Proceedings of the ACM Symposium on Applied Computing in SAC
Páginas: 1398-1403
Conference
26Th Annual Acm Symposium on Applied Computing, Sac 2011, Date: 21 March 2011 through 24 March 2011, Location: TaiChung, Patrocinadores: ACM Special Interest Group on Applied Computing (SIGAPP);Tunghai University;Taiwan Ministry of Education;Taiwan Bureau of Foreign Trade;Taiwan National Science Council (NSC)
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