Characterisation of Iii-Nitride Materials by Synchrotron X-Ray Microdiffraction Reciprocal Space Mapping

AuthID
 P-008-9VK
10
Author(s)
Dolbnya, I
·
O'Donnell, K
·
Sadler, T
·
Li, HN
·
2
Editor(es)
Toropov, A; Ivanov, S
Tipo de Documento
Proceedings Paper
Year published
2013
Publicado
in PHYSICA STATUS SOLIDI C: CURRENT TOPICS IN SOLID STATE PHYSICS, VOL 10, NO 3 in Physica Status Solidi C-Current Topics in Solid State Physics, ISSN: 1862-6351
Volume: 10, Número: 3, Páginas: 481-485 (5)
Conference
4Th International Symposium on Growth of Iii-Nitrides (Isgn), Date: JUL 16-19, 2012, Location: Saint-Petersburg, RUSSIA, Patrocinadores: Russian Acad Sci, Ioffe Phys-Tech Inst, Riber, Aixtron, Komef, U S Army Foward Element Commmand Atlantic, Off Naval Res Sci & Technol, SemiTEq, Veeco, Optogan LED Solut, Crystal IS
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Publication Identifiers
SCOPUS: 2-s2.0-84874986523
Wos: WOS:000317290800050
Source Identifiers
ISSN: 1862-6351
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