A Bent In-Line Mach-Zehnder Interferometer Sensor to Increase Refractive Index Sensitivity

AuthID
 P-008-GJY
6
Author(s)
Costa, A
·
Tipo de Documento
Proceedings Paper
Year published
2013
Publicado
in 2013 SBMO/IEEE MTT-S INTERNATIONAL MICROWAVE & OPTOELECTRONICS CONFERENCE (IMOC)
Conference
15Th Sbmo/Ieee Mtt-S International Microwave & Optoelectronics Conference (Imoc), Date: AUG 04-07, 2013, Location: Pontif Catholic Univ Rio de Janeiro, Rio de Janeiro, BRAZIL, Patrocinadores: Soc Brasilera de Micro ondas e Optoeletrnica, IEEE Microwave Theory & Tech Soc, Conselho Nacl Desenvolvimento Cientifico Tecnolgico, Coordenacao Aperfeicoamento Pessoal Nivel Super, Fundacao Amparo Pesquisa Estado Rio de Janeiro, Pontificia UnivCatolica Rio de Janeiro, Inst Militar Engn, Centro Fedl Educacao Tecnologica Celso Suckow Fonseca, Agilent Technologies Brasil, Anritsu Eletronica Ltda, Centro Pesquisa Desenvolvimento Telecomunicacoes, Comp Simulat Technol, Datason Ind Distribuicao Eletrnicos Ltda, ICA Telecomunicacoes Ltda, EM Software & Syst FEKO, Rohde & Schwarz Brasil, Brazilian Microwave & Optoelectron Soc, Host: Pontif Catholic Univ Rio de Janeiro
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SCOPUS: 2-s2.0-84887447531
Wos: WOS:000359376200144
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