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Bottom-Up Methodology for Test Preparation and Refinement
AuthID
P-008-NGK
6
Author(s)
Gracio, JA
·
Bicudo, PA
·
Rua, NN
·
Oliveira, AM
·
Almeida, CFB
·
Teixeira, JP
1
Editor(s)
Anon
Document Type
Proceedings Paper
Year published
1989
Published
in
Proceedings - IEEE International Symposium on Circuits and Systems,
ISSN: 0271-4310
Volume: 2, Pages: 949-952
Conference
Ieee International Symposium on Circuits and Systems 1989, the 22Nd Iscas. Part 1,
Date:
8 May 1989 through 11 May 1989,
Location:
Portland, OR, USA
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Scopus
®
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Publication Identifiers
Scopus
: 2-s2.0-0024946663
Source Identifiers
ISSN
: 0271-4310
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