Stability of Silicon Microfabricated Pull-In Voltage References

AuthID
P-008-PE6
2
Author(s)
Tipo de Documento
Proceedings Paper
Year published
2002
Publicado
in 2002 CONFERENCE ON PRECISION ELECTROMAGNETIC MEASUREMENTS, CONFERENCE DIGEST, ISSN: 0589-1485
Páginas: 172-173 (2)
Conference
Conference on Precision Electromagnetic Measurements (Cpem 2002), Date: JUN 16-21, 2002, Location: OTTAWA, CANADA, Patrocinadores: Bureau Int Poids Measures, IEEE Instrumentat & Measurement Soc, Natl Inst Stand & Technol, Int Union Pure & Appl Phys, Measurements Int Ltd, Natl Conf Stand Lab Int, Natl Res Council Canada, Union Radio Sci Int
Indexing
Publication Identifiers
SCOPUS: 2-s2.0-0036393659
Wos: WOS:000178482400082
Source Identifiers
ISSN: 0589-1485
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