Characterisation of the Fatigued State of Ferroelectric Pzt Thin-Film Capacitors

AuthID
P-008-RTS
6
Author(s)
Colla, EL
·
Taylor, D
·
Tagantsev, AK
·
Brooks, KG
·
Setter, N
Tipo de Documento
Article
Year published
1995
Publicado
in MICROELECTRONIC ENGINEERING, ISSN: 0167-9317
Volume: 29, Número: 1-4, Páginas: 145-148 (4)
Conference
1St European Meeting on Integrated Ferroelectrics (Emif 1), at the 8Th European Meeting on Ferroelectrics (Emf 8), Date: JUL 03-05, 1995, Location: NIJMEGEN, NETHERLANDS, Patrocinadores: European Commiss, GEC Marconi, Philips Res, Siemens, Thomson CSF, Univ Nijmegen Univ, Fac Sci, Host: UNIV NIJMEGEN, FAC SCI
Indexing
Publication Identifiers
SCOPUS: 2-s2.0-0029492235
Wos: WOS:A1995TP60800029
Source Identifiers
ISSN: 0167-9317
Export Publication Metadata
Citações
Oops! It looks like you don't have access to this content.

This section is restricted to uses with b-on access.



CORE Conference
No information about CORE Rank

During the preprocessing phase, only publications of type 'Proceedings Paper' or 'Proceedings' are automatically processed to identify their CORE Rank.

TIP: If your publication's CORE Rank is missing, you can contact with your institutional manager to have the correct ranking manually added to the record.

Journal Factors
Oops! It looks like you don't have access to this content.

This section is restricted to uses with b-on access.