Publicações

Interferometric Study of Piezoelectric Degradation in Ferroelectric Thin Films

AuthID
P-008-RTZ

Author(s)

Kholkin, A

Colla, E

Brooks, K

Muralt, P

Kohli, M

Maeder, T

Taylor, D

Setter, N

Tipo de Documento

Article

Year published

1995

Publicado

in MICROELECTRONIC ENGINEERING, ISSN: 0167-9317

Volume: 29, Número: 1-4, Páginas: 261-264 (4)

Conference

1St European Meeting on Integrated Ferroelectrics (Emif 1), at the 8Th European Meeting on Ferroelectrics (Emf 8), Date: JUL 03-05, 1995, Location: NIJMEGEN, NETHERLANDS, Patrocinadores: European Commiss, GEC Marconi, Philips Res, Siemens, Thomson CSF, Univ Nijmegen Univ, Fac Sci, Host: UNIV NIJMEGEN, FAC SCI

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