Electric-Field Profiling In 2D Semiconductors Exhibiting Electrical Instabilities

AuthID
 P-008-S32
4
Author(s)
BALKAN, N
·
VICKERS, AJ
Tipo de Documento
Article
Year published
1994
Publicado
in SEMICONDUCTOR SCIENCE AND TECHNOLOGY, ISSN: 0268-1242
Volume: 9, Número: 5, Páginas: 619-622 (4)
Conference
8Th International Conference on Hot Carriers in Semiconductors, Date: AUG 16-20, 1993, Location: OXFORD, ENGLAND, Patrocinadores: SCI & ENGN RES COUNCIL, ROYAL SOC, BRIT COUNCIL, OXFORD UNIV, Host: OXFORD UNIV
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Publication Identifiers
Wos: WOS:A1994NM75300059
Source Identifiers
ISSN: 0268-1242
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