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Recessed Source Geometry For Source Excited X-Ray Fluorescence Analysis.
AuthID
P-008-SZG
2
Author(s)
Conde, CAN
·
dos Santos, JMF
Document Type
Proceedings Paper
Year published
1986
Published
in
Advances in X-Ray Analysis,
ISSN: 0376-0308
Volume: 29, Pages: 545-550
Conference
Advances in X-Ray Analysis.,
Location:
Snowmass, CO, USA,
Sponsors:
Univ of Denver, Denver Research Inst, Denver, CO, USA;Joint Committee on Powder Diffraction Standards
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Scopus
: 2-s2.0-0022988153
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ISSN
: 0376-0308
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