Non Invasive Electrical Characterization of Semiconductor at Bulk and Interfaces

AuthID
 P-008-XMJ
7
Author(s)
Vanderhaghen, R
·
Kasouit, S
·
Drevillon, B
·
Kim, H
·
Kleider, JP
1
Editor(es)
Razeghi M.Brown G.J.
Tipo de Documento
Proceedings Paper
Year published
2003
Publicado
in Proceedings of SPIE - The International Society for Optical Engineering, ISSN: 0277-786X
Volume: 4999, Páginas: 261-278
Conference
Quantum Sensing: Evolution and Revolution from Past to Future, Date: 27 January 2003 through 30 January 2003, Location: San Jose, CA
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Publication Identifiers
SCOPUS: 2-s2.0-0141790167
Source Identifiers
ISSN: 0277-786X
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