Depth Profiling And Diffusion Of **2**2Ne Implanted In Tantalum By (P, Gamma ) Resonance Broadening.

AuthID
 P-008-YDZ
4
Author(s)
Da Silva, MF
·
Melo, AA
·
Freitag, K
·
Tipo de Documento
Article
Year published
1982
Publicado
in Nuclear instruments and methods in physics research, ISSN: 0167-5087
Volume: 209-210, Número: Pt 2, Páginas: 889-893
Conference
Ion Beam Modif of Mater, Proc of the Int Conf, 3Rd, Date: 6 September 1982 through 10 September 1982, Location: Grenoble, Fr
Indexing
Scopus®
Crossref®
Google Scholar®
Publication Identifiers
SCOPUS: 2-s2.0-0020127719
Source Identifiers
ISSN: 0167-5087
Export Publication Metadata
Lista Marked
 Adicionar à lista Marked
Info
At this moment we don't have any links to full text documens.

Um espaço para investigadores e suas Instituições

Links Úteis

Ajuda

© 2025 CRACS & Inesc TEC - All Rights Reserved Política de Privacidade | Terms of Service