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High-Selectivity Single-Chip Spectrometer for Operation at Visible Wavelengths
AuthID
P-008-YJ9
3
Author(s)
Correia, JH
·
Bartek, M
·
Wolffenbuttel, RF
1
Editor(s)
Anon
Document Type
Proceedings Paper
Year published
1998
Published
in
INTERNATIONAL ELECTRON DEVICES MEETING 1998 - TECHNICAL DIGEST,
ISSN: 0163-1918
Pages: 467-470 (4)
Conference
International Electron Devices Meeting (Iedm),
Date:
DEC 06-09, 1998,
Location:
SAN FRANCISCO, CA,
Sponsors:
Electron Devices Soc IEEE
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®
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Metadata
Sources
Publication Identifiers
DOI
:
10.1109/iedm.1998.746399
Scopus
: 2-s2.0-0032255796
Wos
: WOS:000078581800108
Source Identifiers
ISSN
: 0163-1918
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