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Determination Of The Ion Yield And The Electron Lifetime In Tms By A Pulse Method.
AuthID
P-009-1AG
3
Author(s)
Lopes, MI
·
Masuda, K
·
Doke, T
Document Type
Proceedings Paper
Year published
1987
Published
Conference
Conference Record - Ninth International Conference on Conduction and Breakdown in Dielectric Liquids.,
Location:
Salford, Engl,
Sponsors:
IEEE, Electrical Insulation Soc, New York, NY, USA;Univ of Salford, Dep of Electronic & Electrical Engineering,
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: 2-s2.0-0023590784
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