Toggle navigation
Publicações
Investigadores
Instituições
0
Entrar
Autenticação Federada
(Click on the image)
Autenticação local
Recuperação de Password
Register
Entrar
Publicações
Procurar
Estatísticas
Rtl Design Validation, Dft and Test Pattern Generation for High Defects Coverage
AuthID
P-000-X2N
4
Author(s)
Santos, MB
·
Goncalves, FM
·
Teixeira, IC
·
Teixeira, JP
Document Type
Proceedings Paper
Year published
2001
Published
in
ETW 2001: IEEE EUROPEAN TEST WORKSHOP, PROCEEDINGS
Pages: 99-105 (7)
Conference
Ieee European Test Workshop (Etw 01),
Date:
MAY 29-JUN 01, 2001,
Location:
STOCKHOLM, SWEDEN,
Sponsors:
IEEE Comp Soc Test Technol Council, Linkoping Univ, Ericsson, Philips, Mentor Graph
Indexing
Wos
®
Metadata
Sources
Publication Identifiers
Wos
: WOS:000172784500013
Export Publication Metadata
Export
×
Publication Export Settings
BibTex
EndNote
APA
Export Preview
Lista
Marked
Adicionar à lista
Marked
Info
At this moment we don't have any links to full text documens.
×
Select Source
This publication has:
2 records from
ISI
2 records from
SCOPUS
2 records from
DBLP
2 records from
Unpaywall
Please select which records must be used by Authenticus!
×
Preview Publications
© 2024 CRACS & Inesc TEC - All Rights Reserved
Privacy Policy
|
Terms of Service