Self Ion Irradiated Si Probed with Enhanced Depth Resolution Positron Annihilation Spectroscopy

AuthID
 P-009-2V1
4
Author(s)
Knights, AP
·
Nejim, A
·
Coleman, PG
Document Type
Article
Year published
1999
Published
in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, ISSN: 0168-583X
Volume: 148, Issue: 1-4, Pages: 340-344 (5)
Conference
11Th International Conference on Ion Beam Modification of Materials (Ibmm98), Date: AUG 31-SEP 04, 1998, Location: AMSTERDAM, NETHERLANDS, Host: ROYAL TROP INST
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Publication Identifiers
Scopus: 2-s2.0-0033513856
Wos: WOS:000078575700061
Source Identifiers
ISSN: 0168-583X
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