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Self Ion Irradiated Si Probed with Enhanced Depth Resolution Positron Annihilation Spectroscopy

AuthID
P-009-2V1

Author(s)

Knights, AP

Nejim, A

Barradas, NP

Coleman, PG

Tipo de Documento

Article

Year published

1999

Publicado

in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, ISSN: 0168-583X

Volume: 148, Número: 1-4, Páginas: 340-344 (5)

Conference

11Th International Conference on Ion Beam Modification of Materials (Ibmm98), Date: AUG 31-SEP 04, 1998, Location: AMSTERDAM, NETHERLANDS, Host: ROYAL TROP INST

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Publication Identifiers

DOI: 10.1016/s0168-583x(98)00718-6

SCOPUS: 2-s2.0-0033513856

Wos: WOS:000078575700061

Source Identifiers

ISSN: 0168-583X

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Self Ion Irradiated Si Probed with Enhanced Depth Resolution Positron Annihilation Spectroscopy

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