Defect-Oriented Mixed-Level Fault Simulation of Digital Systems-On-A-Chip Using Hdl

AuthID
 P-009-4YV
2
Author(s)
Teixeira, JP
2
Editor(es)
Borrione, D; Ernst, R
Tipo de Documento
Proceedings Paper
Year published
1999
Publicado
in DESIGN, AUTOMATION AND TEST IN EUROPE CONFERENCE AND EXHIBITION 1999, PROCEEDINGS, ISSN: 1530-1591
Páginas: 549-553 (5)
Conference
Design, Automation and Test in Europe Conference and Exhibition, Date: MAR 09-12, 1999, Location: MUNICH, GERMANY, Patrocinadores: EDAA, EDAC, IEEE Comp Soc-TTTC, ACM-SIGDA, IFP 10.5, ECSI, RAS
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Publication Identifiers
SCOPUS: 2-s2.0-84893629710
Wos: WOS:000079489400091
Source Identifiers
ISSN: 1530-1591
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