Integration of an Atomic Force Microscope in a Beamline Sample Environment

AuthID
P-009-F1R
9
Author(s)
Hrouzek, M
·
Dhez, O
·
Chevrier, J
·
Comin, F
·
Garrett, R
·
Nugent, K
·
Wilkins, S
4
Editor(es)
Garrett, R; Gentle, I; Nugent, K; Wilkins, S
Tipo de Documento
Proceedings Paper
Year published
2010
Publicado
in SRI 2009: THE 10TH INTERNATIONAL CONFERENCE ON SYNCHROTRON RADIATION INSTRUMENTATION in AIP Conference Proceedings, ISSN: 0094-243X
Volume: 1234, Páginas: 609-612 (4)
Conference
10Th International Conference on Synchrotron Radiation Instrumentation, Date: SEP 27-OCT 02, 2009, Location: Melbourne, AUSTRALIA, Patrocinadores: Australian Synchrotron, State Govt Victoria, Australian Govt, Dept Innovat, Ind Sci & Res, Elsevier, Int Atom Energy Agcy, Australian Res Council, Mol & Mat Struct Network, JJ X ray A s, Lightsources, Host: Australian Synchrotron
Indexing
Publication Identifiers
SCOPUS: 2-s2.0-77955032560
Wos: WOS:000283705500136
Source Identifiers
ISSN: 0094-243X
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