The Effect of Microlenses in Photodiodes' Dark Current Measurement

AuthID
 P-009-Z1P
5
Author(s)
Tipo de Documento
Proceedings Paper
Year published
2014
Publicado
in 2014 SCIENCE AND INFORMATION CONFERENCE (SAI)
Páginas: 868-870 (3)
Conference
Science and Information Conference (Sai), Date: AUG 27-29, 2014, Location: Sci & Informat Org, London, ENGLAND, Patrocinadores: Microsoft, RK Trans2Cloud, Springer, IEEE Comp Soc, UKRI Sect, IEEE Computat Intelligence Soc, UKRI Sect, IEEE, Host: Sci & Informat Org
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Publication Identifiers
SCOPUS: 2-s2.0-84909592360
Wos: WOS:000367072600120
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