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Tem and Hrtem Characterization of Tial Diffusion Bonds Using Ni/Al Nanolayers
AuthID
P-00A-ANH
5
Author(s)
Simoes, S
·
Viana, F
·
Ramos, AS
·
Vieira, MT
·
Vieira, MF
Document Type
Article
Year published
2015
Published
in
MICROSCOPY AND MICROANALYSIS,
ISSN: 1431-9276
Volume: 21, Issue: 1, Pages: 132-139 (8)
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Wos
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Scopus
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13
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Publication Identifiers
DOI
:
10.1017/s1431927614013087
Scopus
: 2-s2.0-84925248499
Wos
: WOS:000351763500013
Source Identifiers
ISSN
: 1431-9276
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