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Rtl-Based Functional Test Generation for High Defects Coverage in Digital Socs
AuthID
P-001-1MK
4
Author(s)
Santos, MB
·
Goncalves, FM
·
Teixeira, IC
·
Teixeira, JP
Document Type
Proceedings Paper
Year published
2000
Published
in
IEEE EUROPEAN TEST WORKSHOP, PROCEEDINGS
Pages: 99-104 (6)
Conference
Ieee European Test Workshop,
Date:
MAY 23-26, 2000,
Location:
CASCAIS, PORTUGAL,
Sponsors:
IEEE Comp Soc, Test Technol Tech Council, Lisbon Tech Univ, Elect & Comp Engn Dept
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