in JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, ISSN: 0923-8174
Volume: 15, Issue: 1-2, Pages: 41-52 (12)
Conference
Proceedings of the 1998 16Th Ieee Vlsi Test Symposium, (Vts 98): Test Innovations for Highly Complex, High Speed, Deep Submicron Ic's, Date: 26 April 1998 through 30 April 1998, Location: Monterey, CA, USA
