Publicações

Role of the Hot Wire Filament Temperature on the Structure and Morphology of the Nanocrystalline Silicon P-Doped Films

AuthID
P-001-4NB

Author(s)

Ferreira, I

Aguas, H

Mendes, L

Martins, R

Tipo de Documento

Article

Year published

1999

Publicado

in APPLIED SURFACE SCIENCE, ISSN: 0169-4332

Volume: 144-45, Número: 0, Páginas: 690-696 (7)

Conference

14Th International Vacuum Congress/10Th International Conference on Solid Surfaces/5Th International Conference on Nanometre-Scale Science and Technology/10Th International Conference on Quantitative Surface Analysis, Date: AUG 31-SEP 04, 1998, Location: BIRMINGHAM, ENGLAND, Patrocinadores: British Vacuum Council, Inst Phys, Int Union Vacuum Sci Tech & Applicat

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Publication Identifiers

DOI: 10.1016/s0169-4332(98)00905-2

SCOPUS: 2-s2.0-0032647996

Wos: WOS:000080552300138

Source Identifiers

ISSN: 0169-4332

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Role of the Hot Wire Filament Temperature on the Structure and Morphology of the Nanocrystalline Silicon P-Doped Films

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Role of the Hot Wire Filament Temperature on the Structure and Morphology of the Nanocrystalline Silicon P-Doped Films

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