in 17TH IEEE VLSI TEST SYMPOSIUM, PROCEEDINGS in IEEE VLSI TEST SYMPOSIUM, ISSN: 1093-0167
Páginas: 473-480 (4)
Conference
17Th Ieee Very Large Scale Intergration Test Symposium, Date: APR 25-29, 1999, Location: DANA POINT, CA, Patrocinadores: IEEE, Comp Soc, Tech Comm Test Technol
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