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Automated Adc Characterisation Using the Histogram Test Stimulated by Gaussian Noise
AuthID
P-001-9XV
2
Author(s)
Martins, RC
·
Serra, AMC
1
Editor(s)
Nelson, TL
Document Type
Proceedings Paper
Year published
1998
Published
in
1998 CONFERENCE ON PRECISION ELECTROMAGNETIC MEASUREMENTS DIGEST,
ISSN: 0589-1485
Pages: 313-314 (2)
Conference
1998 Conference on Precision Electromagnetic Measurements (Cpem 98),
Date:
JUL 06-10, 1998,
Location:
WASHINGTON, D.C.,
Sponsors:
Natl Inst Stand & Technol, Bur Int Poids & Mesures, IEEE, Instrumentat & Measurement Soc, Natl Res Council Canada, Union Radio Sci Int, Amer Assoc Lab Accreditat, Andeen Hagerling Inc, APS, Instrument & Measurement Sci Top Grp, APS, Precis Measurement & Fundamental Constants, Baltimore Gas & Elect, Cal Lab Magazine, Clarke Hess Commun Res Corp, Creat Mkt Assoc, Fluke Corp, Guildline Instruments, Hewlett Packard Co, Instrument Support Solut Div, IEEE, Instrument & Measurement Soc, Washington Chapter, IEEE, Natl Capital Area Council, Natl Conf Stand Lab, Org Amer States, Wavetek Corp
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Scopus
: 2-s2.0-0032296479
Wos
: WOS:000075725900163
Source Identifiers
ISSN
: 0589-1485
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