Defect Level Evaluation in an Ic Design Environment

AuthID
 P-001-DKB
6
Author(s)
deSousa, JT
·
Teixeira, JP
·
Marzocca, C
·
Corsi, F
·
Williams, TW
Document Type
Article
Year published
1996
Published
in IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, ISSN: 0278-0070
Volume: 15, Issue: 10, Pages: 1286-1293 (8)
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Scopus®
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Publication Identifiers
Scopus: 2-s2.0-0030263876
Wos: WOS:A1996VR33700010
Source Identifiers
ISSN: 0278-0070
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