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Test Preparation for High Coverage of Physical Defects in Cmos Digital Ics
AuthID
P-00F-GPZ
4
Author(s)
Santos, MB
·
Simoes, M
·
Teixeira, I
·
Teixeira, JP
Document Type
Proceedings Paper
Year published
1995
Published
in
Proceedings of the IEEE VLSI Test Symposium
Pages: 330-335
Conference
Proceedings of the 13Th Ieee Vlsi Test Symposium,
Date:
30 April 1995 through 3 May 1995,
Location:
Princeton, NJ, USA,
Sponsors:
IEEE
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Scopus
: 2-s2.0-0029214664
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