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Probabilistic Testability Analysis and Dft Methods at Rtl
AuthID
P-00F-HH3
4
Author(s)
Fernandas, JM
·
Santos, MB
·
Oliveira, AL
·
Teixeira, JC
Document Type
Proceedings Paper
Year published
2006
Published
in
2006 IEEE Design and Diagnostics of Electronic Circuits and systems
Volume: 2006, Pages: 214-215
Conference
2006 Ieee Design and Diagnostics of Electronic Circuits and Systems,
Date:
18 April 2006 through 21 April 2006,
Location:
Praque
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Metadata
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Publication Identifiers
DOI
:
10.1109/ddecs.2006.1649614
Scopus
: 2-s2.0-33847148458
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