in FIFTH INTERNATIONAL CONFERENCE ON MATERIAL SCIENCE AND MATERIAL PROPERTIES FOR INFRARED OPTOELECTRONICS in PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS (SPIE), ISSN: 0277-786X
Volume: 4355, Páginas: 238-251 (6)
Conference
5Th International Conference on Material Science and Material Properties for Infrared Optoelectronics, Date: MAY 22-24, 2000, Location: KIEV, UKRAINE, Patrocinadores: Natl Acad Sci Ukrain, Inst Semiconduct Phys, SPIE, Ukraine Chapter, Minist Educ & Sci Ukraine, Ukrainian Phys Soc
