Internal Photoemission Measurements For The Determination Of Schottky Barrier Height On A-Si,Ge:h,F Alloys.

AuthID
 P-00F-MMG
4
Author(s)
Aljishi, S
·
Slobodin, D
·
Wagner, S
Tipo de Documento
Proceedings Paper
Year published
1986
Publicado
in Materials Research Society Symposia Proceedings, ISSN: 0272-9172
Volume: 70, Páginas: 295-300
Conference
Materials Issues in Amorphous Semiconductor Technology., Location: Palo Alto, CA, USA, Patrocinadores: Materials Research Soc, Pittsburgh, PA, USA
Indexing
Scopus®
Publication Identifiers
SCOPUS: 2-s2.0-0023020358
Source Identifiers
ISSN: 0272-9172
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