Characterizing the Gate to Source Nonlinear Capacitor Role on Fet Imd Performance

AuthID
 P-00F-NSG
6
Author(s)
Garcia, JA
·
Tazon, A
·
Garcia, JL
1
Editor(es)
Meixner R.
Tipo de Documento
Proceedings Paper
Year published
1998
Publicado
in IEEE MTT-S International Microwave Symposium Digest, ISSN: 0149-645X
Volume: 3, Número: 12, Páginas: 1635-1638
Conference
Proceedings of the 1998 Ieee Mtt-S International Microwave Symposium. Part 1 (Of 3), Date: 7 June 1998 through 12 June 1998, Location: Baltimore, MD, USA, Patrocinadores: IEEE
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Scopus®
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Publication Identifiers
SCOPUS: 2-s2.0-0031632560
Source Identifiers
ISSN: 0149-645X
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