Publicações

Self-Cleaning Effect and Compensation Mechanism in Cl-Doped High Resistivity Cadmium Telluride

AuthID
P-00F-P4M

Author(s)

Baventsov, V

Corregidor, V

Benz, K

Feltgen, T

Fiederle, M

Dieguez, E

Editor(s)

Goodnick, SM; Kailey, WF; Longshore, RE; Zhang, YH

Document Type

Proceedings Paper

Year published

1999

Published

in MATERIALS AND ELECTRONICS FOR HIGH-SPEED AND INFRARED DETECTORS in PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS (SPIE), ISSN: 0277-786X

Volume: 3794, Pages: 88-95 (8)

Conference

Conference on Materials and Electronics for High-Speed and Infrared Detectors, Date: JUL 19-23, 1999, Location: DENVER, CO, Sponsors: SPIE

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