In Vivo Measurement of Skull and Brain Resistivities with Eit Based Method and Analysis of Sef/Sep Data

AuthID
 P-00F-PPY
3
Author(s)
De Munck, JC
·
Verbunt, JPA
Tipo de Documento
Proceedings Paper
Year published
2001
Publicado
in Annual Reports of the Research Reactor Institute, Kyoto University, ISSN: 0454-9244
Volume: 1, Páginas: 1006-1008
Conference
23Rd Annual International Conference of the Ieee Engineering in Medicine and Biology Society, Date: 25 October 2001 through 28 October 2001, Location: Istanbul, Patrocinadores: IEEE
Indexing
Scopus®
Publication Identifiers
SCOPUS: 2-s2.0-0035781789
Source Identifiers
ISSN: 0454-9244
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