Hard X-Ray Polarimetry with a Thick Cdte Position Sensitive Spectrometer

AuthID
 P-00F-QFR
10
Author(s)
Caroli, E
·
Bertuccio, G
·
Cola, A
·
Donati, A
·
Dusi, W
·
Landini, G
·
Siffert, P
·
Sampietro, M
·
Stephen, JB
Tipo de Documento
Proceedings Paper
Year published
2000
Publicado
in Proceedings of SPIE - The International Society for Optical Engineering, ISSN: 0277-786X
Volume: 4140, Páginas: 573-583
Conference
X-Ray and Gamma-Ray Instrumentation for Astronomy Xi, Date: 2 August 2000 through 4 August 2000, Location: San Diego, CA,USA, Patrocinadores: SPIE-The International Society for Optical Engineering
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Publication Identifiers
SCOPUS: 2-s2.0-0142181437
Source Identifiers
ISSN: 0277-786X
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