The Use of Neutron Diffraction in the Quantitative Characterization of Dopant-Dependent Dynamical Properties of Semiconductors

AuthID
 P-00F-RC8
4
Author(s)
Martin y Marero, DMY
·
Fiederle, M
·
Dieguez, E
Document Type
Article
Year published
2004
Published
in PHYSICA B-CONDENSED MATTER, ISSN: 0921-4526
Volume: 350, Issue: 1-3, Pages: E549-E552 (4)
Indexing
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Scopus®
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Google Scholar®
Publication Identifiers
Scopus: 2-s2.0-23144435808
Wos: WOS:000207887900137
Source Identifiers
ISSN: 0921-4526
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