Performance, Reliability, Radiation Effects, and Aging Issues in Microelectronics - From Atomic-Scale Physics to Engineering-Level Modeling

AuthID
 P-00F-W5T
11
Author(s)
Pantelides, ST
·
Tsetseris, L
·
Beck, MJ
·
Rashkeev, SN
·
Hadjisavvas, G
·
Batyrev, IG
·
Tuttle, BR
·
Zhou, XJ
·
Fleetwood, DM
·
Schrimpf, RD
Tipo de Documento
Proceedings Paper
Year published
2009
Publicado
in ESSDERC 2009 - Proceedings of the 39th European Solid-State Device Research Conference
Páginas: 48-55
Conference
39Th European Solid-State Device Research Conference, Essderc 2009, Date: 14 September 2009 through 18 September 2009, Location: Athens
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Publication Identifiers
SCOPUS: 2-s2.0-72849130875
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