Performance, Reliability, Radiation Effects, and Aging Issues in Microelectronics - From Atomic-Scale Physics to Engineering-Level Modeling

AuthID
 P-00F-W5W
11
Author(s)
Pantelides, ST
·
Tsetseris, L
·
Beck, MJ
·
Rashkeev, SN
·
Hadjisavvas, G
·
Batyrev, IG
·
Tuttle, BR
·
Zhou, XJ
·
Fleetwood, DM
·
Schrimpf, RD
Tipo de Documento
Proceedings Paper
Year published
2009
Publicado
in ESSCIRC 2009 - Proceedings of the 35th European Solid-State Circuits Conference
Páginas: 76-83
Conference
35Th European Solid-State Circuits Conference, Esscirc 2009, Date: 14 September 2009 through 18 September 2009, Location: Athens, Patrocinadores: National and Kapodistrian University of Athens;Raith - Innovative Solutions for Nanofabrication and;Semiconductor Navigation;NXP;HellenicSIA
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Publication Identifiers
SCOPUS: 2-s2.0-72849144825
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