Performance, Reliability, Radiation Effects, and Aging Issues in Microelectronics - From Atomic-Scale Physics to Engineering-Level Modeling

AuthID
 P-00F-WFY
11
Author(s)
Pantelides, ST
·
Tsetseris, L
·
Beck, MJ
·
Rashkeev, SN
·
Hadjisavvas, G
·
Batyrev, IG
·
Tuttle, BR
·
Zhou, XJ
·
Fleetwood, DM
·
Schrimpf, RD
Tipo de Documento
Proceedings Paper
Year published
2010
Publicado
in Solid-State Electronics, ISSN: 0038-1101
Volume: 54, Número: 9, Páginas: 841-848
Indexing
Scopus®
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Google Scholar®
Publication Identifiers
SCOPUS: 2-s2.0-77954218607
Source Identifiers
ISSN: 0038-1101
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