Physical Dft for High Coverage of Realistic Faults

AuthID
P-00G-9JW
7
Author(s)
SARAIVA, M
·
CASIMIRO, P
·
SOUSA, JT
·
GONCALVES, F
·
TEIXEIRA, I
·
TEIXEIRA, JP
Document Type
Proceedings Paper
Year published
1992
Published
in INTERNATIONAL TEST CONFERENCE 1992 : PROCEEDINGS: DISCOVER THE NEW WORLD OF TEST AND DESIGN
Pages: 642-651 (10)
Conference
1992 International Test Conf On Discover The New World Of Test And Design, Date: SEP 20-24, 1992, Location: BALTIMORE, MD, Sponsors: IEEE, COMPUTER SOC, TEST TECHNOL TECH COMM, IEEE, PHILADELPHIA SECT
Indexing
Publication Identifiers
Wos: WOS:A1992BX97X00086
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