Static And Dynamic Testing Of A/D Converters Using A Vxi Based System

AuthID
P-001-M66
2
Author(s)
Tipo de Documento
Proceedings Paper
Year published
1994
Publicado
in 10TH ANNIVERSARY, IMTC/94 - ADVANCED TECHNOLOGIES IN I & M, CONFERENCE PROCEEDINGS, VOLS 1-3 AND SUPPLEMENT
Volume: 2, Páginas: 903-906 (4)
Conference
1994 Ieee Instrumentation and Measurement Technology Conference - Advanced Technologies in I and M (Imtc/94), Date: MAY 10-12, 1994, Location: HAMAMATSU, JAPAN, Patrocinadores: IEEE, INSTRUMENTAT & MEASUREMENT SOC, SOC INSTRUMENT & CONTROL ENGINEERS, JAPAN
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Publication Identifiers
SCOPUS: 2-s2.0-0028740233
Wos: WOS:A1994BC27G00236
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