Response-Time Measurements In Microcrystalline Silicon

AuthID
P-001-MCW
8
Author(s)
WANG, F
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GREBNER, S
·
FISCHER, T
·
KOYNOV, S
·
·
Document Type
Article
Year published
1993
Published
in JOURNAL OF NON-CRYSTALLINE SOLIDS, ISSN: 0022-3093
Volume: 166, Issue: PART 1, Pages: 477-480 (4)
Conference
15Th International Conference on Amorphous Semiconductors, Date: SEP 06-10, 1993, Location: CAMBRIDGE, ENGLAND, Sponsors: IUPAP, HITACHI LTD, FUJI ELECT CO LTD, INT COMMUN SPECIALISTS, BNR STL, TAYLOR & FRANCIS LTD, INST MAT, INST ELECT ENGINEERS, INT SCI FDN, WELSH DEV AGCY, SANYO ELECT CO LTD, KANEKA CORP, OXFORD INSTRUMENTS LTD, ICI ZENECA, IBM US, INST PHYS, ROYAL SOC, BRIT COUNCIL, BANK SCOTLAND
Indexing
Publication Identifiers
Scopus: 2-s2.0-0027906827
Wos: WOS:A1993MT01200116
Source Identifiers
ISSN: 0022-3093
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