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Microtopographic Inspection Of Surfaces - A Comparison Between Moire, Contrived Lightning And Discreet Triangulation Methods

AuthID
P-001-NMH

Author(s)

COSTA, MFM

ALMEIDA, JB

Editor(es)

Kwon, OY; Brown, GM; Kujawinska, M

Tipo de Documento

Proceedings Paper

Year published

1993

Publicado

in INTERFEROMETRY VI: TECHNIQUES AND ANALYSIS in PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS (SPIE)

Volume: 2003, Páginas: 30-37 (8)

Conference

Conference on Interferometry Vi: Techniques and Analysis, Date: JUL 12-13, 1993, Location: SAN DIEGO, CA, Patrocinadores: SOC PHOTO OPT INSTRUMENTAT ENGINEERS, SOC EXPTL MECH

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Publication Identifiers

DOI: 10.1117/12.165479

Wos: WOS:A1993BZ81H00004

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Microtopographic Inspection Of Surfaces - A Comparison Between Moire, Contrived Lightning And Discreet Triangulation Methods

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