A Fast Spatial Variation Modeling Algorithm for Efficient Test Cost Reduction of Analog/Rf Circuits

AuthID
 P-00G-TQ9
6
Author(s)
Gonçalves, HR
·
Li, X
·
Tavares, V
·
Carulli Jr., JM
·
Butler, KM
Tipo de Documento
Proceedings Paper
Year published
2015
Publicado
in DATE, ISSN: 15301591
Volume: 2015-April, Páginas: 1042-1047 (5)
Indexing
Scopus®
Dblp®/pt/publications/view/551657
Google Scholar®
Publication Identifiers
DBLP: conf/date/GoncalvesLCTCB15
SCOPUS: 2-s2.0-84945913938
Source Identifiers
ISSN: 15301591
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