Improving the Tolerance of Pipeline Based Circuits to Power Supply or Temperature Variations

AuthID
 P-000-5HT
6
Author(s)
Rodriguez Andina, JJ
·
Vargas, F
·
Teixeira, IC
·
Teixeira, JP
4
Editor(s)
Bolchini, C; Kim, YB; Salsano, A; Touba, N
Document Type
Proceedings Paper
Year published
2005
Published
in DFT 2007: 22ND IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT-TOLERANCE IN VLSI SYSTEMS, PROCEEDINGS
Pages: 303-311 (9)
Conference
22Nd Ieee International Symposium on Defect and Fault-Tolerance in Vlsi Systems, Date: SEP 26-28, 2007, Location: Rome, ITALY, Sponsors: IEEE, IEEE Comp Soc Test Technol Tech Council, IEEE Comp Soc TC Fault-Tolerant Comp, IEEE Comp Soc
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Publication Identifiers
Wos: WOS:000251315800033
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