In-Situ Study of Ni–Ti Thin Film Growth on a Tin Intermediate Layer by X-Ray Diffraction

AuthID
 P-00H-DWN
6
Author(s)
SCHELL, N
·
MAHESH, K
·
Tipo de Documento
Article
Year published
2007
Publicado
in Sensors and Actuators B: Chemical, ISSN: 0925-4005
Volume: 126, Número: 1, Páginas: 332-337
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ISSN: 0925-4005
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