X-Ray Characterization and Domain Structure of High-Quality Srbi 2 Ta 2 O 9 Single-Crystals Grown by Self-Flux Solution Method

AuthID
 P-00H-NHC
5
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Document Type
Article
Year published
2004
Published
in Integrated Ferroelectrics, ISSN: 1058-4587
Volume: 68, Issue: 1, Pages: 259-268
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ISSN: 1058-4587
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