Determination Of Sample Thickness Via Scattered Radiation In X-Ray-Fluorescence Spectrometry With Filtered Continuum Excitation

AuthID
 P-001-S0D
3
Author(s)
VANESPEN, P
·
VANGRIEKEN, R
Tipo de Documento
Article
Year published
1990
Publicado
in X-RAY SPECTROMETRY, ISSN: 0049-8246
Volume: 19, Número: 1, Páginas: 29-33 (5)
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Publication Identifiers
Wos: WOS:A1990CU24700005
Source Identifiers
ISSN: 0049-8246
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