Electric Field Profiling in 2D Semiconductors Exhibiting Electrical Instabilities

AuthID
 P-00J-N6R
4
Author(s)
Cunha, AD
·
Balkan, N
·
Vickers, AJ
Tipo de Documento
Article
Year published
1994
Publicado
in Semiconductor Science and Technology - Semicond. Sci. Technol., ISSN: 0268-1242
Volume: 9, Número: 5S, Páginas: 619-622
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ISSN: 0268-1242
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