Evaluation of Idd/Vout Cross-Correlation for Mixed Current/Voltage Testing of Analogue and Mixed-Signal Circuits

AuthID
 P-00J-XMX
2
Author(s)
Tipo de Documento
Proceedings Paper
Year published
1996
Publicado
in 1996 European Design and Test Conference, ED&TC 1996, Paris, France, March 11-14, 1996 in ED&TC
Páginas: 264-269
Conference
1996 European Conference on Design and Test, Edtc 1996, Date: 11 March 1996 through 14 March 1996, Patrocinadores: ACM Special Interest Group on Design Automation (SIGDA)
Indexing
Scopus®
Dblp®/pt/publications/view/620189
Crossref®1
Google Scholar®
Publication Identifiers
DBLP: conf/date/SilvaM96
SCOPUS: 2-s2.0-85030104109
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