Evaluation of Idd/Vout Cross-Correlation for Mixed Current/Voltage Testing of Analogue and Mixed-Signal Circuits

AuthID
 P-00J-XMX
2
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Tipo de Documento
Proceedings Paper
Year published
1996
Publicado
in ED&TC
Páginas: 264-269 (4)
Indexing
Scopus®
Dblp®/pt/publications/view/620189
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Google Scholar®
Publication Identifiers
DBLP: conf/date/SilvaM96
SCOPUS: 2-s2.0-85030104109
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